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Cleverscope | Oscilloscopes

Cleverscope Automated Test Equipment (ATE) & Power Supply Noise Analysis

Precision You Can Trust
NABL-Accreditied Calibration | Available on Request

Cleverscope provides advanced solutions for automated test equipment (ATE) and power supply noise analysis. It offers low-cost, high-performance measurement tools for testing printed circuit boards (PCBs) and analyzing power supply noise, suitable for applications in manufacturing and design validation..

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  • Special Features
  • Specification

Cleverscope is an innovative tool for both Automated Test Equipment (ATE) systems and power supply noise analysis. In ATE applications, Cleverscope provides a low-cost alternative to traditional oscilloscopes, integrating a signal source and multiple measurement inputs into one compact unit. It's ideal for systems where rapid state changes and high throughput are critical.

For power supply noise analysis, Cleverscope excels in detecting and measuring power supply noise that can affect analog and digital systems. By measuring both conducted and radiated noise, it helps engineers identify noise problems in devices like MP3 players, cell phones, and other electronics that use switch-mode power supplies.

  • Cost-Effective: Low cost compared to conventional oscilloscopes or plug-in acquisition cards.

  • Multi-Function: Combines a signal source (sine, square, triangle, DC) with 11 measurement inputs (8 digital, 1 external trigger, 2 analog).

  • Compact Size: Saves space in test enclosures, ideal for small systems.

  • Fast Response: Typically 20 ms state change, faster than traditional oscilloscopes.

  • Large Internal Memory: For testing long time sequences (I2C, SPI, serial data, RF, etc.).

  • LabView Driver: Supports ATE system development with LabView.

  • Power Supply Noise Analysis: Measures harmonic and wide-band noise from switch-mode power supplies and analyzes their impact on system performance.

Parameter Details
Test Measurement Inputs 8 digital, 2 analog, 1 external trigger
Signal Source Sine, square, triangle, DC level
Frequency Range 20 Hz to 200 kHz (sweep)
Measurement Memory Large internal memory for long time sequences
Response Time 20 ms typical
Signal Generator Built-in, with adjustable amplitude
LabView Driver Available for ATE system development
Power Supply Noise Analysis Measures harmonic noise, jitter, and radiated noise
Power Supply Compatibility Switch-mode supplies (e.g., 12V, 24V)
Calibration Accuracy +/- 0.85%
Data Resolution 10-bit A/D with dynamic range offset system
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